C₆0和C₇0的电子电离质谱

C 6 0和C 7 0的电子电离质谱 ELECTRON IONIZATION MASS SPECTROMETRY OF C 6 0 AND C 7 0 景治中 1 first-author 王美兰 1 陈涑年 1 朱绫 1 李贵华 1 郝广明 1 盛蓉生 1 武汉大学现代分析科学系 武汉大学现代分析科学系 采用电子电离技术研究了全碳分子C 6 0和C 7 0的正、负离子质谱,观察到了正离子质谱中的三电荷离子,测定了正离子质谱中双电荷离子与电子能量的关系,以及负离子质谱中分子离子丰度与电子能量的关系。 The paper reports the positive and negative ion mass spectrometry of C 6 0 and C 7 0 using electron ionization and In-Beam method. The triply charged ions have been observed in the positive ion mass spectra. The relative inten- sity of doubly and triply charged ions were affected strongly by electron energy. Relationship between the intensity of negative molecular ions and electron energy has been reported as well. C60/C70 多电荷离子 负离子质谱 C60/C70 multiply charged ion negative ion mass spectrometry O657.6 1992-03-01 2021-04-01 3