一种针对软错误的流水线电路加固方案

一种针对软错误的流水线电路加固方案 A Pipeline-Circuit Harden Method for Soft Error Tolerance 吴珍妮 WU Zhenni1 1 first-author 梁华国 LIANG Huaguo2 2 黄正峰 HUANG Zhengfeng2 2 陈秀美 CHEN Xiumei1 1 曹源 CAO Yuan1 1 合肥工业大学计算机与信息学院 合肥工业大学计算机与信息学院 School of Computer and Information,Hefei University of Technology School of Computer and Information,Hefei University of Technology 合肥工业大学电子科学与应用物理学院 合肥工业大学电子科学与应用物理学院 School of Electronic Science and Applied Physics,Hefei University of Technology School of Electronic Science and Applied Physics,Hefei University of Technology 针对纳米级工艺下瞬态故障引发的软错误可能造成电路失效这一问题,提出一种容软错误的流水线电路加固方案.该方案面向软错误的主要诱因——单事件翻转（single event upset,SEU）,利用新型的容错结构锁存器（radiation hardened by design latch,RHBDL）,构造高可靠性的触发器RHBD-DFF,对电路中原始时序单元进行加固,同时对流水线电路进行了软错率理论分析.考虑到加固所带来的附加开销,采取选择性加固的策略,对电路中的关键时序单元进行加固.实验结果表明,基于开销限制前提的选择性加固,能够达到以低开销代价换取高容错性能的目的. Soft error caused by transient faults can lead to circuit failures of nanometer manufacturing process.This paper proposes a circuit harden method for soft-error-tolerance.The method aims at SEU（single event upset）,which is main inducements of soft error,by using a new soft-error-tolerance latch structure（RHBDL,radiation hardened by design latch）,and constructs a high reliable element RHBD-DFF to harden original ones in pipeline circuits.Soft error analysis is taken on.Considering overhead restrictions,sequential elements which are critical in circuits are hardened based on selective hardening method.The random faults injection experiments results indicate that this method can use less overhead to obtain more error-tolerance by selectively hardening critical elements. 软错误 软错误率 锁存器 触发器 电路加固 soft error soft error rate latch flip-flop circuit harden 10.14188/j.1671-8836.2010.02.011 TP332 国家自然科学基金重点资助项目（60633060）;国家自然科学基金资助项目（60876028）;高等学校博士学科点专项科研基金资助项目（200803590006）;安徽省海外高层次人才项目（2008Z014） 2010-02-01 2021-04-01 2 56